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authorSimon Glass <sjg@chromium.org>2014-02-26 15:59:21 -0700
committerTom Rini <trini@ti.com>2014-03-04 12:15:29 -0500
commit2e7d35d2a60339cfa54e26a07326bc75e1060bb3 (patch)
tree0c49d6f7fb9bdaf9cb2b553e6cbd839c7c837ed5 /test/dm/ut.c
parent1ce60176799ae04d508b14e9caa7f3bd3a170f0f (diff)
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dm: Add basic tests
Add some tests of driver model functionality. Coverage includes: - basic init - binding of drivers to devices using platform_data - automatic probing of devices when referenced - availability of platform data to devices - lifecycle from bind to probe to remove to unbind - renumbering within a uclass when devices are probed/removed - calling driver-defined operations - deactivation of drivers when removed - memory leak across creation and destruction of drivers/uclasses - uclass init/destroy methods - automatic probe/remove of children/parents when needed This function is enabled for sandbox, using CONFIG_DM_TEST. Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'test/dm/ut.c')
-rw-r--r--test/dm/ut.c33
1 files changed, 33 insertions, 0 deletions
diff --git a/test/dm/ut.c b/test/dm/ut.c
new file mode 100644
index 0000000..8b69bc2
--- /dev/null
+++ b/test/dm/ut.c
@@ -0,0 +1,33 @@
+/*
+ * Simple unit test library for driver model
+ *
+ * Copyright (c) 2013 Google, Inc
+ *
+ * SPDX-License-Identifier: GPL-2.0+
+ */
+
+#include <common.h>
+#include <dm/test.h>
+#include <dm/ut.h>
+
+struct dm_test_state;
+
+void ut_fail(struct dm_test_state *dms, const char *fname, int line,
+ const char *func, const char *cond)
+{
+ printf("%s:%d, %s(): %s\n", fname, line, func, cond);
+ dms->fail_count++;
+}
+
+void ut_failf(struct dm_test_state *dms, const char *fname, int line,
+ const char *func, const char *cond, const char *fmt, ...)
+{
+ va_list args;
+
+ printf("%s:%d, %s(): %s: ", fname, line, func, cond);
+ va_start(args, fmt);
+ vprintf(fmt, args);
+ va_end(args);
+ putc('\n');
+ dms->fail_count++;
+}