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| author | Simon Glass <sjg@chromium.org> | 2016-02-29 15:26:02 -0700 |
|---|---|---|
| committer | Simon Glass <sjg@chromium.org> | 2016-03-14 15:34:50 -0600 |
| commit | 61ccd886e2b3751da40a3ecf0e3cd6c91557e9e3 (patch) | |
| tree | c489818cc35226843c4d624c60da17fe13a3a240 /include/atmel_mci.h | |
| parent | 07b2b78ce4bc8ae25e066c65245eaf58c0d9a67c (diff) | |
| download | u-boot-imx-61ccd886e2b3751da40a3ecf0e3cd6c91557e9e3.zip u-boot-imx-61ccd886e2b3751da40a3ecf0e3cd6c91557e9e3.tar.gz u-boot-imx-61ccd886e2b3751da40a3ecf0e3cd6c91557e9e3.tar.bz2 | |
dm: usb: Clean up USB after each test
The USB subsystem has a few counters that need to be reset since they are
stored in static variables rather than driver-model data. An example is
usb_max_devs. Ultimately we should move this data into the USB uclass.
For now, make sure that USB is reset after each test, so that the counters
go back to zero.
Note: this is not a perfect solution: It a USB test fails it will exit
immediately and leave USB un-reset. The impact here is that it may cause
subsequence test failures in the same run.
Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'include/atmel_mci.h')
0 files changed, 0 insertions, 0 deletions