From 3884c98c32cd5fb5b5b42185d5d0575659434bbf Mon Sep 17 00:00:00 2001
From: Simon Glass <sjg@chromium.org>
Date: Sun, 8 Nov 2015 23:47:44 -0700
Subject: dm: usb: Avoid time delays in sandbox tests

Currently the USB tests take around two seconds to run. Remove these
unnecessary time delays so that the tests run quickly.

Signed-off-by: Simon Glass <sjg@chromium.org>
---
 test/dm/test-main.c | 2 ++
 test/dm/usb.c       | 3 +++
 2 files changed, 5 insertions(+)

(limited to 'test/dm')

diff --git a/test/dm/test-main.c b/test/dm/test-main.c
index 0e43ab9..a36a9c0 100644
--- a/test/dm/test-main.c
+++ b/test/dm/test-main.c
@@ -9,6 +9,7 @@
 #include <dm.h>
 #include <errno.h>
 #include <malloc.h>
+#include <asm/state.h>
 #include <dm/test.h>
 #include <dm/root.h>
 #include <dm/uclass-internal.h>
@@ -113,6 +114,7 @@ static int dm_test_main(const char *test_name)
 			ut_assertok(dm_scan_fdt(gd->fdt_blob, false));
 
 		test->func(uts);
+		state_set_skip_delays(false);
 
 		ut_assertok(dm_test_destroy(uts));
 	}
diff --git a/test/dm/usb.c b/test/dm/usb.c
index 9939d83..4300bbd 100644
--- a/test/dm/usb.c
+++ b/test/dm/usb.c
@@ -8,6 +8,8 @@
 #include <dm.h>
 #include <usb.h>
 #include <asm/io.h>
+#include <asm/state.h>
+#include <dm/device-internal.h>
 #include <dm/test.h>
 #include <test/ut.h>
 
@@ -35,6 +37,7 @@ static int dm_test_usb_flash(struct unit_test_state *uts)
 	block_dev_desc_t *dev_desc;
 	char cmp[1024];
 
+	state_set_skip_delays(true);
 	ut_assertok(usb_init());
 	ut_assertok(uclass_get_device(UCLASS_MASS_STORAGE, 0, &dev));
 	ut_assertok(get_device("usb", "0", &dev_desc));
-- 
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