From e721b882e9daf3ad3599eef5a9ccf3847b694228 Mon Sep 17 00:00:00 2001
From: Joe Hershberger <joe.hershberger@ni.com>
Date: Wed, 20 May 2015 14:27:27 -0500
Subject: test: Generalize the unit test framework

Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.

Signed-off-by: Joe Hershberger <joe.hershberger@ni.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
---
 test/dm/regulator.c | 16 ++++++++--------
 1 file changed, 8 insertions(+), 8 deletions(-)

(limited to 'test/dm/regulator.c')

diff --git a/test/dm/regulator.c b/test/dm/regulator.c
index c4f14bd..d279c04 100644
--- a/test/dm/regulator.c
+++ b/test/dm/regulator.c
@@ -14,13 +14,13 @@
 #include <malloc.h>
 #include <dm/device-internal.h>
 #include <dm/root.h>
-#include <dm/ut.h>
 #include <dm/util.h>
 #include <dm/test.h>
 #include <dm/uclass-internal.h>
 #include <power/pmic.h>
 #include <power/regulator.h>
 #include <power/sandbox_pmic.h>
+#include <test/ut.h>
 
 DECLARE_GLOBAL_DATA_PTR;
 
@@ -47,7 +47,7 @@ static const char *regulator_names[OUTPUT_COUNT][OUTPUT_NAME_COUNT] = {
 };
 
 /* Test regulator get method */
-static int dm_test_power_regulator_get(struct dm_test_state *dms)
+static int dm_test_power_regulator_get(struct unit_test_state *uts)
 {
 	struct dm_regulator_uclass_platdata *uc_pdata;
 	struct udevice *dev_by_devname;
@@ -92,7 +92,7 @@ static int dm_test_power_regulator_get(struct dm_test_state *dms)
 DM_TEST(dm_test_power_regulator_get, DM_TESTF_SCAN_FDT);
 
 /* Test regulator set and get Voltage method */
-static int dm_test_power_regulator_set_get_voltage(struct dm_test_state *dms)
+static int dm_test_power_regulator_set_get_voltage(struct unit_test_state *uts)
 {
 	struct dm_regulator_uclass_platdata *uc_pdata;
 	struct udevice *dev;
@@ -119,7 +119,7 @@ static int dm_test_power_regulator_set_get_voltage(struct dm_test_state *dms)
 DM_TEST(dm_test_power_regulator_set_get_voltage, DM_TESTF_SCAN_FDT);
 
 /* Test regulator set and get Current method */
-static int dm_test_power_regulator_set_get_current(struct dm_test_state *dms)
+static int dm_test_power_regulator_set_get_current(struct unit_test_state *uts)
 {
 	struct dm_regulator_uclass_platdata *uc_pdata;
 	struct udevice *dev;
@@ -158,7 +158,7 @@ static int dm_test_power_regulator_set_get_current(struct dm_test_state *dms)
 DM_TEST(dm_test_power_regulator_set_get_current, DM_TESTF_SCAN_FDT);
 
 /* Test regulator set and get Enable method */
-static int dm_test_power_regulator_set_get_enable(struct dm_test_state *dms)
+static int dm_test_power_regulator_set_get_enable(struct unit_test_state *uts)
 {
 	const char *platname;
 	struct udevice *dev;
@@ -177,7 +177,7 @@ static int dm_test_power_regulator_set_get_enable(struct dm_test_state *dms)
 DM_TEST(dm_test_power_regulator_set_get_enable, DM_TESTF_SCAN_FDT);
 
 /* Test regulator set and get mode method */
-static int dm_test_power_regulator_set_get_mode(struct dm_test_state *dms)
+static int dm_test_power_regulator_set_get_mode(struct unit_test_state *uts)
 {
 	const char *platname;
 	struct udevice *dev;
@@ -196,7 +196,7 @@ static int dm_test_power_regulator_set_get_mode(struct dm_test_state *dms)
 DM_TEST(dm_test_power_regulator_set_get_mode, DM_TESTF_SCAN_FDT);
 
 /* Test regulator autoset method */
-static int dm_test_power_regulator_autoset(struct dm_test_state *dms)
+static int dm_test_power_regulator_autoset(struct unit_test_state *uts)
 {
 	const char *platname;
 	struct udevice *dev, *dev_autoset;
@@ -276,7 +276,7 @@ static const struct setting expected_setting_list[] = {
 static int list_count = ARRAY_SIZE(expected_setting_list);
 
 /* Test regulator list autoset method */
-static int dm_test_power_regulator_autoset_list(struct dm_test_state *dms)
+static int dm_test_power_regulator_autoset_list(struct unit_test_state *uts)
 {
 	struct udevice *dev_list[2], *dev;
 	int i;
-- 
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