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* dm: Use dm_scan_fdt_dev() directly where possibleSimon Glass2016-07-27-2/+2
| | | | | | | Quite a few places have a bind() method which just calls dm_scan_fdt_dev(). We may as well call dm_scan_fdt_dev() directly. Update the code to do this. Signed-off-by: Simon Glass <sjg@chromium.org>
* test: Generalize the unit test frameworkJoe Hershberger2015-05-21-4/+4
| | | | | | | | | Separate the ability to define tests and assert status of test functions from the dm tests so they can be used more consistently throughout all tests. Signed-off-by: Joe Hershberger <joe.hershberger@ni.com> Reviewed-by: Simon Glass <sjg@chromium.org>
* dm: spi: Move slave details to child platdataSimon Glass2015-01-29-3/+3
| | | | | | | | | | | | | | | | At present we go through various contortions to store the SPI slave's chip select in its private data. This only exists when the slave is active so must be set up when it is probed. Until the device is probed we don't actually know what chip select it will appear on. However, now that we can support per-child platform data, we can use that instead. This allows us to set up the chip select when the child is bound, and avoid the messy contortions. Unfortunately this is a fairly large change and it seems to be difficult to break it down further. Signed-off-by: Simon Glass <sjg@chromium.org>
* dm: spi: Add testsSimon Glass2014-10-22-0/+127
These tests use SPI flash (and the sandbox emulation) to operate. Signed-off-by: Simon Glass <sjg@chromium.org> Acked-by: Jagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>