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* dm: i2c: Add tests for I2CSimon Glass2014-12-11-0/+1
| | | | | | | Add some basic tests to check that the system works as expected. Signed-off-by: Simon Glass <sjg@chromium.org> Acked-by: Heiko Schocher <hs@denx.de>
* dm: sf: Add tests for SPI flashSimon Glass2014-10-22-0/+1
| | | | | | | | | Add a simple test for SPI that uses SPI flash. It operates by creating a SPI flash file and using the 'sf test' command to test that all operations work correctly. Signed-off-by: Simon Glass <sjg@chromium.org> Acked-by: Jagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>
* dm: spi: Add testsSimon Glass2014-10-22-0/+1
| | | | | | | These tests use SPI flash (and the sandbox emulation) to operate. Signed-off-by: Simon Glass <sjg@chromium.org> Acked-by: Jagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>
* dm: Provide a function to scan child FDT nodesSimon Glass2014-07-23-0/+1
| | | | | | | | | | | | | | At present only root nodes in the device tree are scanned for devices. But some devices can have children. For example a SPI bus may have several children for each of its chip selects. Add a function which scans subnodes and binds devices for each one. This can be used for the root node scan also, so change it. A device can call this function in its bind() or probe() methods to bind its children. Signed-off-by: Simon Glass <sjg@chromium.org>
* dm: Allow driver model tests only for sandboxSimon Glass2014-06-20-0/+2
| | | | | | | The GPIO tests require the sandbox GPIO driver, so cannot be run on other platforms. Similarly for the 'dm test' command. Signed-off-by: Simon Glass <sjg@chromium.org>
* dm: Add a 'dm' command for testingSimon Glass2014-03-04-0/+1
| | | | | | | | | | | This command is not required for driver model operation, but can be useful for testing. It provides simple dumps of internal data structures. Signed-off-by: Simon Glass <sjg@chromium.org> Signed-off-by: Marek Vasut <marex@denx.de> Signed-off-by: Pavel Herrmann <morpheus.ibis@gmail.com> Signed-off-by: Viktor Křivák <viktor.krivak@gmail.com> Signed-off-by: Tomas Hlavacek <tmshlvck@gmail.com>
* dm: Add basic testsSimon Glass2014-03-04-0/+17
Add some tests of driver model functionality. Coverage includes: - basic init - binding of drivers to devices using platform_data - automatic probing of devices when referenced - availability of platform data to devices - lifecycle from bind to probe to remove to unbind - renumbering within a uclass when devices are probed/removed - calling driver-defined operations - deactivation of drivers when removed - memory leak across creation and destruction of drivers/uclasses - uclass init/destroy methods - automatic probe/remove of children/parents when needed This function is enabled for sandbox, using CONFIG_DM_TEST. Signed-off-by: Simon Glass <sjg@chromium.org>