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* sandbox: add ADC unit testsPrzemyslaw Marczak2015-11-02-0/+4
| | | | | | | | | | | | | | | | | | | | | | | | This commit adds unit tests for ADC uclass's methods using sandbox ADC. Testing proper ADC binding: - dm_test_adc_bind() - device binding - dm_test_adc_wrong_channel_selection() - checking wrong channel selection Testing ADC supply operations: - dm_test_adc_supply(): - Vdd/Vss values validating - Vdd regulator updated value validating - Vdd regulator's auto enable state validating Testing ADC operations results: - dm_test_adc_single_channel_conversion() - single channel start/data - dm_test_adc_single_channel_shot() - single channel shot - dm_test_adc_multi_channel_conversion() - multi channel start/data - dm_test_adc_multi_channel_shot() - multi channel single shot Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com> Cc: Simon Glass <sjg@chromium.org> Signed-off-by: Minkyu Kang <mk7.kang@samsung.com>
* dm: pmic: Split output from functionSimon Glass2015-07-21-2/+2
| | | | | | | | | | | | | | | The regulator_autoset() function mixes printf() output and PMIC adjustment code. It provides a boolean to control the output. It is better to avoid missing logic and output, and this permits a smaller SPL code size. So split the output into a separate function. Also rename the function to have a by_name() suffix, since we would like to be able to pass a device when we know it, and thus avoid the name search. Signed-off-by: Simon Glass <sjg@chromium.org> Tested-by: Przemyslaw Marczak <p.marczak@samsung.com> Acked-by: Przemyslaw Marczak <p.marczak@samsung.com>
* test: dm: add sandbox PMIC framework testsPrzemyslaw Marczak2015-05-14-0/+33
| | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | | This change adds new file to sandbox driver model test environment. The file is: test/dm/power.c, and it includes tests for PMIC framework, which includes PMIC uclass and REGULATOR uclass. All tests are based od Sandbox PMIC emulated device. Some test constants for this device are defined in the header: include/power/sandbox_pmic.h PMIC tests includes: - pmic get - tests, that pmic_get() returns the requested device - pmic I/O - tests I/O by writing and reading some values to PMIC's registers and then compares, that the write/read values are equal. The regulator tests includes: - Regulator get by devname/platname - Voltage set/get - Current set/get - Enable set/get - Mode set/get - Autoset - List autoset For the regulator 'get' test, the returned device pointers are compared, and their names are also compared to the requested one. Every other test, first sets the given attribute and next try to get it. The test pass, when the set/get values are equal. Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com> Acked-by: Simon Glass <sjg@chromium.org> Tested on sandbox: Tested-by: Simon Glass <sjg@chromium.org>
* sandbox: add: sandbox PMIC device drivers: I2C emul, pmic, regulatorPrzemyslaw Marczak2015-05-14-0/+105
This commit adds emulation of sandbox PMIC device, which includes: - PMIC I2C emulation driver - PMIC I/O driver (UCLASS_PMIC) - PMIC regulator driver (UCLASS_REGULATOR) The sandbox PMIC has 12 significant registers and 4 as padding to 16 bytes, which allows using 'i2c md' command with the default count (16). The sandbox PMIC provides regulators: - 2x BUCK - 2x LDO Each, with adjustable output: - Enable state - Voltage - Current limit (LDO1/BUCK1 only) - Operation mode (different for BUCK and LDO) Each attribute has it's own register, beside the enable state, which depends on operation mode. The header file: sandbox_pmic.h includes PMIC's default register values, which are set on i2c pmic emul driver's probe() method. Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com> Acked-by: Simon Glass <sjg@chromium.org> Tested on sandbox: Tested-by: Simon Glass <sjg@chromium.org>