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Diffstat (limited to 'include/linux/mtd/nand_new.h')
| -rw-r--r-- | include/linux/mtd/nand_new.h | 469 |
1 files changed, 0 insertions, 469 deletions
diff --git a/include/linux/mtd/nand_new.h b/include/linux/mtd/nand_new.h deleted file mode 100644 index 7d4b805..0000000 --- a/include/linux/mtd/nand_new.h +++ /dev/null @@ -1,469 +0,0 @@ -/* - * linux/include/linux/mtd/nand.h - * - * Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com> - * Steven J. Hill <sjhill@realitydiluted.com> - * Thomas Gleixner <tglx@linutronix.de> - * - * $Id: nand.h,v 1.68 2004/11/12 10:40:37 gleixner Exp $ - * - * This program is free software; you can redistribute it and/or modify - * it under the terms of the GNU General Public License version 2 as - * published by the Free Software Foundation. - * - * Info: - * Contains standard defines and IDs for NAND flash devices - * - * Changelog: - * 01-31-2000 DMW Created - * 09-18-2000 SJH Moved structure out of the Disk-On-Chip drivers - * so it can be used by other NAND flash device - * drivers. I also changed the copyright since none - * of the original contents of this file are specific - * to DoC devices. David can whack me with a baseball - * bat later if I did something naughty. - * 10-11-2000 SJH Added private NAND flash structure for driver - * 10-24-2000 SJH Added prototype for 'nand_scan' function - * 10-29-2001 TG changed nand_chip structure to support - * hardwarespecific function for accessing control lines - * 02-21-2002 TG added support for different read/write adress and - * ready/busy line access function - * 02-26-2002 TG added chip_delay to nand_chip structure to optimize - * command delay times for different chips - * 04-28-2002 TG OOB config defines moved from nand.c to avoid duplicate - * defines in jffs2/wbuf.c - * 08-07-2002 TG forced bad block location to byte 5 of OOB, even if - * CONFIG_MTD_NAND_ECC_JFFS2 is not set - * 08-10-2002 TG extensions to nand_chip structure to support HW-ECC - * - * 08-29-2002 tglx nand_chip structure: data_poi for selecting - * internal / fs-driver buffer - * support for 6byte/512byte hardware ECC - * read_ecc, write_ecc extended for different oob-layout - * oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB, - * NAND_YAFFS_OOB - * 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL - * Split manufacturer and device ID structures - * - * 02-08-2004 tglx added option field to nand structure for chip anomalities - * 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id - * update of nand_chip structure description - */ -#ifndef __LINUX_MTD_NAND_NEW_H -#define __LINUX_MTD_NAND_NEW_H - -#include <linux/mtd/compat.h> -#include <linux/mtd/mtd.h> - -struct mtd_info; -/* Scan and identify a NAND device */ -extern int nand_scan (struct mtd_info *mtd, int max_chips); -/* Free resources held by the NAND device */ -extern void nand_release (struct mtd_info *mtd); - -/* Read raw data from the device without ECC */ -extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen); - - - -/* This constant declares the max. oobsize / page, which - * is supported now. If you add a chip with bigger oobsize/page - * adjust this accordingly. - */ -#define NAND_MAX_OOBSIZE 64 - -/* - * Constants for hardware specific CLE/ALE/NCE function -*/ -/* Select the chip by setting nCE to low */ -#define NAND_CTL_SETNCE 1 -/* Deselect the chip by setting nCE to high */ -#define NAND_CTL_CLRNCE 2 -/* Select the command latch by setting CLE to high */ -#define NAND_CTL_SETCLE 3 -/* Deselect the command latch by setting CLE to low */ -#define NAND_CTL_CLRCLE 4 -/* Select the address latch by setting ALE to high */ -#define NAND_CTL_SETALE 5 -/* Deselect the address latch by setting ALE to low */ -#define NAND_CTL_CLRALE 6 -/* Set write protection by setting WP to high. Not used! */ -#define NAND_CTL_SETWP 7 -/* Clear write protection by setting WP to low. Not used! */ -#define NAND_CTL_CLRWP 8 - -/* - * Standard NAND flash commands - */ -#define NAND_CMD_READ0 0 -#define NAND_CMD_READ1 1 -#define NAND_CMD_PAGEPROG 0x10 -#define NAND_CMD_READOOB 0x50 -#define NAND_CMD_ERASE1 0x60 -#define NAND_CMD_STATUS 0x70 -#define NAND_CMD_STATUS_MULTI 0x71 -#define NAND_CMD_SEQIN 0x80 -#define NAND_CMD_READID 0x90 -#define NAND_CMD_ERASE2 0xd0 -#define NAND_CMD_RESET 0xff - -/* Extended commands for large page devices */ -#define NAND_CMD_READSTART 0x30 -#define NAND_CMD_CACHEDPROG 0x15 - -/* Status bits */ -#define NAND_STATUS_FAIL 0x01 -#define NAND_STATUS_FAIL_N1 0x02 -#define NAND_STATUS_TRUE_READY 0x20 -#define NAND_STATUS_READY 0x40 -#define NAND_STATUS_WP 0x80 - -/* - * Constants for ECC_MODES - */ - -/* No ECC. Usage is not recommended ! */ -#define NAND_ECC_NONE 0 -/* Software ECC 3 byte ECC per 256 Byte data */ -#define NAND_ECC_SOFT 1 -/* Hardware ECC 3 byte ECC per 256 Byte data */ -#define NAND_ECC_HW3_256 2 -/* Hardware ECC 3 byte ECC per 512 Byte data */ -#define NAND_ECC_HW3_512 3 -/* Hardware ECC 3 byte ECC per 512 Byte data */ -#define NAND_ECC_HW6_512 4 -/* Hardware ECC 8 byte ECC per 512 Byte data */ -#define NAND_ECC_HW8_512 6 -/* Hardware ECC 12 byte ECC per 2048 Byte data */ -#define NAND_ECC_HW12_2048 7 - -/* - * Constants for Hardware ECC -*/ -/* Reset Hardware ECC for read */ -#define NAND_ECC_READ 0 -/* Reset Hardware ECC for write */ -#define NAND_ECC_WRITE 1 -/* Enable Hardware ECC before syndrom is read back from flash */ -#define NAND_ECC_READSYN 2 - -/* Option constants for bizarre disfunctionality and real -* features -*/ -/* Chip can not auto increment pages */ -#define NAND_NO_AUTOINCR 0x00000001 -/* Buswitdh is 16 bit */ -#define NAND_BUSWIDTH_16 0x00000002 -/* Device supports partial programming without padding */ -#define NAND_NO_PADDING 0x00000004 -/* Chip has cache program function */ -#define NAND_CACHEPRG 0x00000008 -/* Chip has copy back function */ -#define NAND_COPYBACK 0x00000010 -/* AND Chip which has 4 banks and a confusing page / block - * assignment. See Renesas datasheet for further information */ -#define NAND_IS_AND 0x00000020 -/* Chip has a array of 4 pages which can be read without - * additional ready /busy waits */ -#define NAND_4PAGE_ARRAY 0x00000040 - -/* Options valid for Samsung large page devices */ -#define NAND_SAMSUNG_LP_OPTIONS \ - (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK) - -/* Macros to identify the above */ -#define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR)) -#define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING)) -#define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG)) -#define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK)) - -/* Mask to zero out the chip options, which come from the id table */ -#define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR) - -/* Non chip related options */ -/* Use a flash based bad block table. This option is passed to the - * default bad block table function. */ -#define NAND_USE_FLASH_BBT 0x00010000 -/* The hw ecc generator provides a syndrome instead a ecc value on read - * This can only work if we have the ecc bytes directly behind the - * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */ -#define NAND_HWECC_SYNDROME 0x00020000 - - -/* Options set by nand scan */ -/* Nand scan has allocated oob_buf */ -#define NAND_OOBBUF_ALLOC 0x40000000 -/* Nand scan has allocated data_buf */ -#define NAND_DATABUF_ALLOC 0x80000000 - - -/* - * nand_state_t - chip states - * Enumeration for NAND flash chip state - */ -typedef enum { - FL_READY, - FL_READING, - FL_WRITING, - FL_ERASING, - FL_SYNCING, - FL_CACHEDPRG, -} nand_state_t; - -/* Keep gcc happy */ -struct nand_chip; - -#if 0 -/** - * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices - * @lock: protection lock - * @active: the mtd device which holds the controller currently - */ -struct nand_hw_control { - spinlock_t lock; - struct nand_chip *active; -}; -#endif - -/** - * struct nand_chip - NAND Private Flash Chip Data - * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device - * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device - * @read_byte: [REPLACEABLE] read one byte from the chip - * @write_byte: [REPLACEABLE] write one byte to the chip - * @read_word: [REPLACEABLE] read one word from the chip - * @write_word: [REPLACEABLE] write one word to the chip - * @write_buf: [REPLACEABLE] write data from the buffer to the chip - * @read_buf: [REPLACEABLE] read data from the chip into the buffer - * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data - * @select_chip: [REPLACEABLE] select chip nr - * @block_bad: [REPLACEABLE] check, if the block is bad - * @block_markbad: [REPLACEABLE] mark the block bad - * @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines - * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line - * If set to NULL no access to ready/busy is available and the ready/busy information - * is read from the chip status register - * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip - * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready - * @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware - * @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw) - * @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only - * be provided if a hardware ECC is available - * @erase_cmd: [INTERN] erase command write function, selectable due to AND support - * @scan_bbt: [REPLACEABLE] function to scan bad block table - * @eccmode: [BOARDSPECIFIC] mode of ecc, see defines - * @eccsize: [INTERN] databytes used per ecc-calculation - * @eccbytes: [INTERN] number of ecc bytes per ecc-calculation step - * @eccsteps: [INTERN] number of ecc calculation steps per page - * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR) - * @chip_lock: [INTERN] spinlock used to protect access to this structure and the chip - * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress - * @state: [INTERN] the current state of the NAND device - * @page_shift: [INTERN] number of address bits in a page (column address bits) - * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock - * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry - * @chip_shift: [INTERN] number of address bits in one chip - * @data_buf: [INTERN] internal buffer for one page + oob - * @oob_buf: [INTERN] oob buffer for one eraseblock - * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized - * @data_poi: [INTERN] pointer to a data buffer - * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about - * special functionality. See the defines for further explanation - * @badblockpos: [INTERN] position of the bad block marker in the oob area - * @numchips: [INTERN] number of physical chips - * @chipsize: [INTERN] the size of one chip for multichip arrays - * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1 - * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf - * @autooob: [REPLACEABLE] the default (auto)placement scheme - * @bbt: [INTERN] bad block table pointer - * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup - * @bbt_md: [REPLACEABLE] bad block table mirror descriptor - * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan - * @controller: [OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices - * @priv: [OPTIONAL] pointer to private chip date - */ - -struct nand_chip { - void __iomem *IO_ADDR_R; - void __iomem *IO_ADDR_W; - - u_char (*read_byte)(struct mtd_info *mtd); - void (*write_byte)(struct mtd_info *mtd, u_char byte); - u16 (*read_word)(struct mtd_info *mtd); - void (*write_word)(struct mtd_info *mtd, u16 word); - - void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len); - void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len); - int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len); - void (*select_chip)(struct mtd_info *mtd, int chip); - int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip); - int (*block_markbad)(struct mtd_info *mtd, loff_t ofs); - void (*hwcontrol)(struct mtd_info *mtd, int cmd); - int (*dev_ready)(struct mtd_info *mtd); - void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr); - int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state); - int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code); - int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc); - void (*enable_hwecc)(struct mtd_info *mtd, int mode); - void (*erase_cmd)(struct mtd_info *mtd, int page); - int (*scan_bbt)(struct mtd_info *mtd); - int eccmode; - int eccsize; - int eccbytes; - int eccsteps; - int chip_delay; -#if 0 - spinlock_t chip_lock; - wait_queue_head_t wq; - nand_state_t state; -#endif - int page_shift; - int phys_erase_shift; - int bbt_erase_shift; - int chip_shift; - u_char *data_buf; - u_char *oob_buf; - int oobdirty; - u_char *data_poi; - unsigned int options; - int badblockpos; - int numchips; - unsigned long chipsize; - int pagemask; - int pagebuf; - struct nand_oobinfo *autooob; - uint8_t *bbt; - struct nand_bbt_descr *bbt_td; - struct nand_bbt_descr *bbt_md; - struct nand_bbt_descr *badblock_pattern; - struct nand_hw_control *controller; - void *priv; -}; - -/* - * NAND Flash Manufacturer ID Codes - */ -#define NAND_MFR_TOSHIBA 0x98 -#define NAND_MFR_SAMSUNG 0xec -#define NAND_MFR_FUJITSU 0x04 -#define NAND_MFR_NATIONAL 0x8f -#define NAND_MFR_RENESAS 0x07 -#define NAND_MFR_STMICRO 0x20 - -/** - * struct nand_flash_dev - NAND Flash Device ID Structure - * - * @name: Identify the device type - * @id: device ID code - * @pagesize: Pagesize in bytes. Either 256 or 512 or 0 - * If the pagesize is 0, then the real pagesize - * and the eraseize are determined from the - * extended id bytes in the chip - * @erasesize: Size of an erase block in the flash device. - * @chipsize: Total chipsize in Mega Bytes - * @options: Bitfield to store chip relevant options - */ -struct nand_flash_dev { - char *name; - int id; - unsigned long pagesize; - unsigned long chipsize; - unsigned long erasesize; - unsigned long options; -}; - -/** - * struct nand_manufacturers - NAND Flash Manufacturer ID Structure - * @name: Manufacturer name - * @id: manufacturer ID code of device. -*/ -struct nand_manufacturers { - int id; - char * name; -}; - -extern struct nand_flash_dev nand_flash_ids[]; -extern struct nand_manufacturers nand_manuf_ids[]; - -/** - * struct nand_bbt_descr - bad block table descriptor - * @options: options for this descriptor - * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE - * when bbt is searched, then we store the found bbts pages here. - * Its an array and supports up to 8 chips now - * @offs: offset of the pattern in the oob area of the page - * @veroffs: offset of the bbt version counter in the oob are of the page - * @version: version read from the bbt page during scan - * @len: length of the pattern, if 0 no pattern check is performed - * @maxblocks: maximum number of blocks to search for a bbt. This number of - * blocks is reserved at the end of the device where the tables are - * written. - * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than - * bad) block in the stored bbt - * @pattern: pattern to identify bad block table or factory marked good / - * bad blocks, can be NULL, if len = 0 - * - * Descriptor for the bad block table marker and the descriptor for the - * pattern which identifies good and bad blocks. The assumption is made - * that the pattern and the version count are always located in the oob area - * of the first block. - */ -struct nand_bbt_descr { - int options; - int pages[NAND_MAX_CHIPS]; - int offs; - int veroffs; - uint8_t version[NAND_MAX_CHIPS]; - int len; - int maxblocks; - int reserved_block_code; - uint8_t *pattern; -}; - -/* Options for the bad block table descriptors */ - -/* The number of bits used per block in the bbt on the device */ -#define NAND_BBT_NRBITS_MSK 0x0000000F -#define NAND_BBT_1BIT 0x00000001 -#define NAND_BBT_2BIT 0x00000002 -#define NAND_BBT_4BIT 0x00000004 -#define NAND_BBT_8BIT 0x00000008 -/* The bad block table is in the last good block of the device */ -#define NAND_BBT_LASTBLOCK 0x00000010 -/* The bbt is at the given page, else we must scan for the bbt */ -#define NAND_BBT_ABSPAGE 0x00000020 -/* The bbt is at the given page, else we must scan for the bbt */ -#define NAND_BBT_SEARCH 0x00000040 -/* bbt is stored per chip on multichip devices */ -#define NAND_BBT_PERCHIP 0x00000080 -/* bbt has a version counter at offset veroffs */ -#define NAND_BBT_VERSION 0x00000100 -/* Create a bbt if none axists */ -#define NAND_BBT_CREATE 0x00000200 -/* Search good / bad pattern through all pages of a block */ -#define NAND_BBT_SCANALLPAGES 0x00000400 -/* Scan block empty during good / bad block scan */ -#define NAND_BBT_SCANEMPTY 0x00000800 -/* Write bbt if neccecary */ -#define NAND_BBT_WRITE 0x00001000 -/* Read and write back block contents when writing bbt */ -#define NAND_BBT_SAVECONTENT 0x00002000 -/* Search good / bad pattern on the first and the second page */ -#define NAND_BBT_SCAN2NDPAGE 0x00004000 - -/* The maximum number of blocks to scan for a bbt */ -#define NAND_BBT_SCAN_MAXBLOCKS 4 - -extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd); -extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs); -extern int nand_default_bbt (struct mtd_info *mtd); -extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt); -extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt); - -/* -* Constants for oob configuration -*/ -#define NAND_SMALL_BADBLOCK_POS 5 -#define NAND_LARGE_BADBLOCK_POS 0 - -#endif /* __LINUX_MTD_NAND_NEW_H */ |