diff options
| -rw-r--r-- | doc/driver-model/README.txt | 3 | ||||
| -rw-r--r-- | drivers/core/uclass.c | 35 | ||||
| -rw-r--r-- | include/dm/uclass.h | 16 | ||||
| -rw-r--r-- | test/dm/test-fdt.c | 30 |
4 files changed, 83 insertions, 1 deletions
diff --git a/doc/driver-model/README.txt b/doc/driver-model/README.txt index 84d21cf..346cf08 100644 --- a/doc/driver-model/README.txt +++ b/doc/driver-model/README.txt @@ -95,12 +95,13 @@ are provided in test/dm. To run them, try: You should see something like this: <...U-Boot banner...> - Running 15 driver model tests + Running 16 driver model tests Test: dm_test_autobind Test: dm_test_autoprobe Test: dm_test_children Test: dm_test_fdt Device 'd-test': seq 3 is in use by 'b-test' + Test: dm_test_fdt_offset Test: dm_test_fdt_pre_reloc Test: dm_test_fdt_uclass_seq Device 'd-test': seq 3 is in use by 'b-test' diff --git a/drivers/core/uclass.c b/drivers/core/uclass.c index c28cf67..a27f3d5 100644 --- a/drivers/core/uclass.c +++ b/drivers/core/uclass.c @@ -187,6 +187,30 @@ int uclass_find_device_by_seq(enum uclass_id id, int seq_or_req_seq, return -ENODEV; } +static int uclass_find_device_by_of_offset(enum uclass_id id, int node, + struct udevice **devp) +{ + struct uclass *uc; + struct udevice *dev; + int ret; + + *devp = NULL; + if (node < 0) + return -ENODEV; + ret = uclass_get(id, &uc); + if (ret) + return ret; + + list_for_each_entry(dev, &uc->dev_head, uclass_node) { + if (dev->of_offset == node) { + *devp = dev; + return 0; + } + } + + return -ENODEV; +} + /** * uclass_get_device_tail() - handle the end of a get_device call * @@ -239,6 +263,17 @@ int uclass_get_device_by_seq(enum uclass_id id, int seq, struct udevice **devp) return uclass_get_device_tail(dev, ret, devp); } +int uclass_get_device_by_of_offset(enum uclass_id id, int node, + struct udevice **devp) +{ + struct udevice *dev; + int ret; + + *devp = NULL; + ret = uclass_find_device_by_of_offset(id, node, &dev); + return uclass_get_device_tail(dev, ret, devp); +} + int uclass_first_device(enum uclass_id id, struct udevice **devp) { struct uclass *uc; diff --git a/include/dm/uclass.h b/include/dm/uclass.h index 48ae242..0b5ade6 100644 --- a/include/dm/uclass.h +++ b/include/dm/uclass.h @@ -122,6 +122,22 @@ int uclass_get_device(enum uclass_id id, int index, struct udevice **devp); int uclass_get_device_by_seq(enum uclass_id id, int seq, struct udevice **devp); /** + * uclass_get_device_by_of_offset() - Get a uclass device by device tree node + * + * This searches the devices in the uclass for one attached to the given + * device tree node. + * + * The device is probed to activate it ready for use. + * + * @id: ID to look up + * @node: Device tree offset to search for (if -ve then -ENODEV is returned) + * @devp: Returns pointer to device (there is only one for each node) + * @return 0 if OK, -ve on error + */ +int uclass_get_device_by_of_offset(enum uclass_id id, int node, + struct udevice **devp); + +/** * uclass_first_device() - Get the first device in a uclass * * @id: Uclass ID to look up diff --git a/test/dm/test-fdt.c b/test/dm/test-fdt.c index d8e94d8..7980a68 100644 --- a/test/dm/test-fdt.c +++ b/test/dm/test-fdt.c @@ -215,3 +215,33 @@ static int dm_test_fdt_uclass_seq(struct dm_test_state *dms) return 0; } DM_TEST(dm_test_fdt_uclass_seq, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); + +/* Test that we can find a device by device tree offset */ +static int dm_test_fdt_offset(struct dm_test_state *dms) +{ + const void *blob = gd->fdt_blob; + struct udevice *dev; + int node; + + node = fdt_path_offset(blob, "/e-test"); + ut_assert(node > 0); + ut_assertok(uclass_get_device_by_of_offset(UCLASS_TEST_FDT, node, + &dev)); + ut_asserteq_str("e-test", dev->name); + + /* This node should not be bound */ + node = fdt_path_offset(blob, "/junk"); + ut_assert(node > 0); + ut_asserteq(-ENODEV, uclass_get_device_by_of_offset(UCLASS_TEST_FDT, + node, &dev)); + + /* This is not a top level node so should not be probed */ + node = fdt_path_offset(blob, "/some-bus/c-test"); + ut_assert(node > 0); + ut_asserteq(-ENODEV, uclass_get_device_by_of_offset(UCLASS_TEST_FDT, + node, &dev)); + + return 0; +} + +DM_TEST(dm_test_fdt_offset, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); |