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authorSimon Glass <sjg@chromium.org>2013-02-24 17:33:18 +0000
committerSimon Glass <sjg@chromium.org>2013-02-28 19:09:22 -0800
commit7ecbd4d70842362c3a8ad9393e9d9aab7e13afbf (patch)
tree67aac08510a16664a005d8c40bc52e2d90e950fa /common
parent51209b1f42cb6d1a7ce7c70be08aef2c988656cc (diff)
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Fix mtest indenting
Some of the inner loops are not indented correctly. Fix this. Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'common')
-rw-r--r--common/cmd_mem.c322
1 files changed, 161 insertions, 161 deletions
diff --git a/common/cmd_mem.c b/common/cmd_mem.c
index 02ff658..5235bfe 100644
--- a/common/cmd_mem.c
+++ b/common/cmd_mem.c
@@ -655,32 +655,31 @@ static ulong mem_test_alt(vu_long *start, vu_long *end)
0xaaaaaaaa, /* alternating 1/0 */
};
- /*
- * Data line test: write a pattern to the first
- * location, write the 1's complement to a 'parking'
- * address (changes the state of the data bus so a
- * floating bus doesn't give a false OK), and then
- * read the value back. Note that we read it back
- * into a variable because the next time we read it,
- * it might be right (been there, tough to explain to
- * the quality guys why it prints a failure when the
- * "is" and "should be" are obviously the same in the
- * error message).
- *
- * Rather than exhaustively testing, we test some
- * patterns by shifting '1' bits through a field of
- * '0's and '0' bits through a field of '1's (i.e.
- * pattern and ~pattern).
- */
- addr = start;
- for (j = 0; j < sizeof(bitpattern) / sizeof(bitpattern[0]);
- j++) {
- val = bitpattern[j];
- for (; val != 0; val <<= 1) {
+ /*
+ * Data line test: write a pattern to the first
+ * location, write the 1's complement to a 'parking'
+ * address (changes the state of the data bus so a
+ * floating bus doesn't give a false OK), and then
+ * read the value back. Note that we read it back
+ * into a variable because the next time we read it,
+ * it might be right (been there, tough to explain to
+ * the quality guys why it prints a failure when the
+ * "is" and "should be" are obviously the same in the
+ * error message).
+ *
+ * Rather than exhaustively testing, we test some
+ * patterns by shifting '1' bits through a field of
+ * '0's and '0' bits through a field of '1's (i.e.
+ * pattern and ~pattern).
+ */
+ addr = start;
+ for (j = 0; j < sizeof(bitpattern) / sizeof(bitpattern[0]); j++) {
+ val = bitpattern[j];
+ for (; val != 0; val <<= 1) {
*addr = val;
*dummy = ~val; /* clear the test data off the bus */
readback = *addr;
- if(readback != val) {
+ if (readback != val) {
printf("FAILURE (data line): "
"expected %08lx, actual %08lx\n",
val, readback);
@@ -703,129 +702,130 @@ static ulong mem_test_alt(vu_long *start, vu_long *end)
return -1;
}
}
- }
}
+ }
- /*
- * Based on code whose Original Author and Copyright
- * information follows: Copyright (c) 1998 by Michael
- * Barr. This software is placed into the public
- * domain and may be used for any purpose. However,
- * this notice must not be changed or removed and no
- * warranty is either expressed or implied by its
- * publication or distribution.
- */
+ /*
+ * Based on code whose Original Author and Copyright
+ * information follows: Copyright (c) 1998 by Michael
+ * Barr. This software is placed into the public
+ * domain and may be used for any purpose. However,
+ * this notice must not be changed or removed and no
+ * warranty is either expressed or implied by its
+ * publication or distribution.
+ */
- /*
- * Address line test
- *
- * Description: Test the address bus wiring in a
- * memory region by performing a walking
- * 1's test on the relevant bits of the
- * address and checking for aliasing.
- * This test will find single-bit
- * address failures such as stuck-high,
- * stuck-low, and shorted pins. The base
- * address and size of the region are
- * selected by the caller.
- *
- * Notes: For best results, the selected base
- * address should have enough LSB 0's to
- * guarantee single address bit changes.
- * For example, to test a 64-Kbyte
- * region, select a base address on a
- * 64-Kbyte boundary. Also, select the
- * region size as a power-of-two if at
- * all possible.
- *
- * Returns: 0 if the test succeeds, 1 if the test fails.
- */
- len = ((ulong)end - (ulong)start)/sizeof(vu_long);
- pattern = (vu_long) 0xaaaaaaaa;
- anti_pattern = (vu_long) 0x55555555;
+ /*
+ * Address line test
+
+ * Description: Test the address bus wiring in a
+ * memory region by performing a walking
+ * 1's test on the relevant bits of the
+ * address and checking for aliasing.
+ * This test will find single-bit
+ * address failures such as stuck-high,
+ * stuck-low, and shorted pins. The base
+ * address and size of the region are
+ * selected by the caller.
+
+ * Notes: For best results, the selected base
+ * address should have enough LSB 0's to
+ * guarantee single address bit changes.
+ * For example, to test a 64-Kbyte
+ * region, select a base address on a
+ * 64-Kbyte boundary. Also, select the
+ * region size as a power-of-two if at
+ * all possible.
+ *
+ * Returns: 0 if the test succeeds, 1 if the test fails.
+ */
+ len = ((ulong)end - (ulong)start)/sizeof(vu_long);
+ pattern = (vu_long) 0xaaaaaaaa;
+ anti_pattern = (vu_long) 0x55555555;
- debug("%s:%d: length = 0x%.8lx\n",
- __func__, __LINE__, len);
- /*
- * Write the default pattern at each of the
- * power-of-two offsets.
- */
- for (offset = 1; offset < len; offset <<= 1)
- start[offset] = pattern;
+ debug("%s:%d: length = 0x%.8lx\n",
+ __func__, __LINE__, len);
+ /*
+ * Write the default pattern at each of the
+ * power-of-two offsets.
+ */
+ for (offset = 1; offset < len; offset <<= 1)
+ start[offset] = pattern;
- /*
- * Check for address bits stuck high.
- */
- test_offset = 0;
- start[test_offset] = anti_pattern;
+ /*
+ * Check for address bits stuck high.
+ */
+ test_offset = 0;
+ start[test_offset] = anti_pattern;
- for (offset = 1; offset < len; offset <<= 1) {
- temp = start[offset];
- if (temp != pattern) {
+ for (offset = 1; offset < len; offset <<= 1) {
+ temp = start[offset];
+ if (temp != pattern) {
printf("\nFAILURE: Address bit stuck high @ 0x%.8lx:"
" expected 0x%.8lx, actual 0x%.8lx\n",
(ulong)&start[offset], pattern, temp);
errs++;
if (ctrlc()) {
- putc('\n');
- return -1;
+ putc('\n');
+ return -1;
}
- }
}
- start[test_offset] = pattern;
- WATCHDOG_RESET();
+ }
+ start[test_offset] = pattern;
+ WATCHDOG_RESET();
- /*
- * Check for addr bits stuck low or shorted.
- */
- for (test_offset = 1; test_offset < len; test_offset <<= 1) {
- start[test_offset] = anti_pattern;
+ /*
+ * Check for addr bits stuck low or shorted.
+ */
+ for (test_offset = 1; test_offset < len; test_offset <<= 1) {
+ start[test_offset] = anti_pattern;
- for (offset = 1; offset < len; offset <<= 1) {
+ for (offset = 1; offset < len; offset <<= 1) {
temp = start[offset];
if ((temp != pattern) && (offset != test_offset)) {
- printf("\nFAILURE: Address bit stuck low or shorted @"
- " 0x%.8lx: expected 0x%.8lx, actual 0x%.8lx\n",
- (ulong)&start[offset], pattern, temp);
- errs++;
- if (ctrlc()) {
- putc('\n');
- return -1;
- }
+ printf("\nFAILURE: Address bit stuck low or"
+ " shorted @ 0x%.8lx: expected 0x%.8lx,"
+ " actual 0x%.8lx\n",
+ (ulong)&start[offset], pattern, temp);
+ errs++;
+ if (ctrlc()) {
+ putc('\n');
+ return -1;
+ }
}
- }
- start[test_offset] = pattern;
}
+ start[test_offset] = pattern;
+ }
- /*
- * Description: Test the integrity of a physical
- * memory device by performing an
- * increment/decrement test over the
- * entire region. In the process every
- * storage bit in the device is tested
- * as a zero and a one. The base address
- * and the size of the region are
- * selected by the caller.
- *
- * Returns: 0 if the test succeeds, 1 if the test fails.
- */
- num_words = ((ulong)end - (ulong)start)/sizeof(vu_long) + 1;
+ /*
+ * Description: Test the integrity of a physical
+ * memory device by performing an
+ * increment/decrement test over the
+ * entire region. In the process every
+ * storage bit in the device is tested
+ * as a zero and a one. The base address
+ * and the size of the region are
+ * selected by the caller.
+ *
+ * Returns: 0 if the test succeeds, 1 if the test fails.
+ */
+ num_words = ((ulong)end - (ulong)start)/sizeof(vu_long) + 1;
- /*
- * Fill memory with a known pattern.
- */
- for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
- WATCHDOG_RESET();
- start[offset] = pattern;
- }
+ /*
+ * Fill memory with a known pattern.
+ */
+ for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
+ WATCHDOG_RESET();
+ start[offset] = pattern;
+ }
- /*
- * Check each location and invert it for the second pass.
- */
- for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
- WATCHDOG_RESET();
- temp = start[offset];
- if (temp != pattern) {
+ /*
+ * Check each location and invert it for the second pass.
+ */
+ for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
+ WATCHDOG_RESET();
+ temp = start[offset];
+ if (temp != pattern) {
printf("\nFAILURE (read/write) @ 0x%.8lx:"
" expected 0x%.8lx, actual 0x%.8lx)\n",
(ulong)&start[offset], pattern, temp);
@@ -834,20 +834,20 @@ static ulong mem_test_alt(vu_long *start, vu_long *end)
putc('\n');
return -1;
}
- }
-
- anti_pattern = ~pattern;
- start[offset] = anti_pattern;
}
- /*
- * Check each location for the inverted pattern and zero it.
- */
- for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
- WATCHDOG_RESET();
- anti_pattern = ~pattern;
- temp = start[offset];
- if (temp != anti_pattern) {
+ anti_pattern = ~pattern;
+ start[offset] = anti_pattern;
+ }
+
+ /*
+ * Check each location for the inverted pattern and zero it.
+ */
+ for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
+ WATCHDOG_RESET();
+ anti_pattern = ~pattern;
+ temp = start[offset];
+ if (temp != anti_pattern) {
printf("\nFAILURE (read/write): @ 0x%.8lx:"
" expected 0x%.8lx, actual 0x%.8lx)\n",
(ulong)&start[offset], anti_pattern, temp);
@@ -856,9 +856,9 @@ static ulong mem_test_alt(vu_long *start, vu_long *end)
putc('\n');
return -1;
}
- }
- start[offset] = 0;
}
+ start[offset] = 0;
+ }
return 0;
}
@@ -886,34 +886,34 @@ static ulong mem_test_quick(vu_long *start, vu_long *end, vu_long pattern,
else
pattern = ~pattern;
}
- printf("\rPattern %08lX Writing..."
- "%12s"
- "\b\b\b\b\b\b\b\b\b\b",
- pattern, "");
+ printf("\rPattern %08lX Writing..."
+ "%12s"
+ "\b\b\b\b\b\b\b\b\b\b",
+ pattern, "");
- for (addr = start, val = pattern; addr < end; addr++) {
- WATCHDOG_RESET();
- *addr = val;
- val += incr;
- }
+ for (addr = start, val = pattern; addr < end; addr++) {
+ WATCHDOG_RESET();
+ *addr = val;
+ val += incr;
+ }
- puts("Reading...");
+ puts("Reading...");
- for (addr = start, val = pattern; addr < end; addr++) {
- WATCHDOG_RESET();
- readback = *addr;
- if (readback != val) {
- printf("\nMem error @ 0x%08X: "
- "found %08lX, expected %08lX\n",
- (uint)(uintptr_t)addr, readback, val);
- errs++;
- if (ctrlc()) {
- putc('\n');
- return -1;
- }
+ for (addr = start, val = pattern; addr < end; addr++) {
+ WATCHDOG_RESET();
+ readback = *addr;
+ if (readback != val) {
+ printf("\nMem error @ 0x%08X: "
+ "found %08lX, expected %08lX\n",
+ (uint)(uintptr_t)addr, readback, val);
+ errs++;
+ if (ctrlc()) {
+ putc('\n');
+ return -1;
}
- val += incr;
}
+ val += incr;
+ }
return 0;
}