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author | wdenk <wdenk> | 2003-09-11 23:06:34 +0000 |
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committer | wdenk <wdenk> | 2003-09-11 23:06:34 +0000 |
commit | 4f7cb08ee7b48a511a9cd2398fd4a243ca2733c7 (patch) | |
tree | 5aadeadbf3f022aa31bd34b35e4ff6f1ff134d74 /board/trab/cmd_trab.c | |
parent | a43278a43d522fba7fea0ed3045b718a9c8d22ac (diff) | |
download | u-boot-imx-4f7cb08ee7b48a511a9cd2398fd4a243ca2733c7.zip u-boot-imx-4f7cb08ee7b48a511a9cd2398fd4a243ca2733c7.tar.gz u-boot-imx-4f7cb08ee7b48a511a9cd2398fd4a243ca2733c7.tar.bz2 |
* Patch by Martin Krause, 11 Sep 2003:
add burn-in tests for TRAB board
* Enable instruction cache on MPC5200 board
Diffstat (limited to 'board/trab/cmd_trab.c')
-rw-r--r-- | board/trab/cmd_trab.c | 821 |
1 files changed, 821 insertions, 0 deletions
diff --git a/board/trab/cmd_trab.c b/board/trab/cmd_trab.c new file mode 100644 index 0000000..0a9768a --- /dev/null +++ b/board/trab/cmd_trab.c @@ -0,0 +1,821 @@ +/* + * (C) Copyright 2003 + * Martin Krause, TQ-Systems GmbH, martin.krause@tqs.de. + * + * See file CREDITS for list of people who contributed to this + * project. + * + * This program is free software; you can redistribute it and/or + * modify it under the terms of the GNU General Public License as + * published by the Free Software Foundation; either version 2 of + * the License, or (at your option) any later version. + * + * This program is distributed in the hope that it will be useful, + * but WITHOUT ANY WARRANTY; without even the implied warranty of + * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the + * GNU General Public License for more details. + * + * You should have received a copy of the GNU General Public License + * along with this program; if not, write to the Free Software + * Foundation, Inc., 59 Temple Place, Suite 330, Boston, + * MA 02111-1307 USA + */ + +#include <common.h> +#include <command.h> +#include <s3c2400.h> + +/* + * TRAB board specific commands. Especially commands for burn-in and function + * test. + */ +#if (CONFIG_COMMANDS & CFG_CMD_BSP) + +/* limits for valid range of VCC5V in mV */ +#define VCC5V_MIN 4500 +#define VCC5V_MAX 5500 + +/* + * Test strings for EEPROM test. Length of string 2 must not exceed length of + * string 1. Otherwise a buffer overrun could occur! + */ +#define EEPROM_TEST_STRING_1 "0987654321 :tset a si siht" +#define EEPROM_TEST_STRING_2 "this is a test: 1234567890" + +/* + * min/max limits for valid contact temperature during burn in test (in + * degree Centigrade * 100) + */ +#define MIN_CONTACT_TEMP -1000 +#define MAX_CONTACT_TEMP +9000 + +/* blinking frequency of status LED */ +#define LED_BLINK_FREQ 5 + +/* delay time between burn in cycles in seconds */ +#ifndef BURN_IN_CYCLE_DELAY /* if not defined in include/configs/trab.h */ +#define BURN_IN_CYCLE_DELAY 5 +#endif + +/* physical SRAM parameters */ +#define SRAM_ADDR 0x02000000 /* GCS1 */ +#define SRAM_SIZE 0x40000 /* 256 kByte */ + +/* CPLD-Register for controlling TRAB hardware functions */ +#define CPLD_BUTTONS ((volatile unsigned long *)0x04020000) +#define CPLD_FILL_LEVEL ((volatile unsigned long *)0x04008000) +#define CPLD_ROTARY_SWITCH ((volatile unsigned long *)0x04018000) +#define CPLD_RS485_RE ((volatile unsigned long *)0x04028000) + +/* I2C EEPROM device address */ +#define I2C_EEPROM_DEV_ADDR 0x54 + +/* EEPROM address map */ +#define EE_ADDR_TEST 128 +#define EE_ADDR_MAX_CYCLES 256 +#define EE_ADDR_STATUS 258 +#define EE_ADDR_PASS_CYCLES 259 +#define EE_ADDR_FIRST_ERROR_CYCLE 261 +#define EE_ADDR_FIRST_ERROR_NUM 263 +#define EE_ADDR_FIRST_ERROR_NAME 264 +#define EE_ADDR_ACT_CYCLE 280 + +/* Bit definitions for ADCCON */ +#define ADC_ENABLE_START 0x1 +#define ADC_READ_START 0x2 +#define ADC_STDBM 0x4 +#define ADC_INP_AIN0 (0x0 << 3) +#define ADC_INP_AIN1 (0x1 << 3) +#define ADC_INP_AIN2 (0x2 << 3) +#define ADC_INP_AIN3 (0x3 << 3) +#define ADC_INP_AIN4 (0x4 << 3) +#define ADC_INP_AIN5 (0x5 << 3) +#define ADC_INP_AIN6 (0x6 << 3) +#define ADC_INP_AIN7 (0x7 << 3) +#define ADC_PRSCEN 0x4000 +#define ADC_ECFLG 0x800 + +/* misc */ + +/* externals */ +extern int memory_post_tests (unsigned long start, unsigned long size); +extern int i2c_write (uchar, uint, int , uchar* , int); +extern int i2c_read (uchar, uint, int , uchar* , int); +extern void tsc2000_reg_init (void); +extern s32 tsc2000_contact_temp (void); +extern void spi_init(void); + +/* function declarations */ +int do_dip (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]); +int do_vcc5v (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]); +int do_burn_in (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]); +int do_contact_temp (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]); +int do_burn_in_status (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]); + +/* helper functions */ +static void adc_init (void); +static int adc_read (unsigned int channel); +static int read_dip (void); +static int read_vcc5v (void); +static int test_dip (void); +static int test_vcc5v (void); +static int test_rotary_switch (void); +static int test_sram (void); +static int test_eeprom (void); +static int test_contact_temp (void); +static int i2c_write_multiple (uchar chip, uint addr, int alen, + uchar *buffer, int len); +static int i2c_read_multiple (uchar chip, uint addr, int alen, + uchar *buffer, int len); +static void led_set (unsigned int); +static void led_blink (void); +static void led_init (void); +static void sdelay (unsigned long seconds); /* delay in seconds */ +static int dummy (void); +static int read_max_cycles(void); +static void test_function_table_init (void); +static void global_vars_init (void); +static int global_vars_write_to_eeprom (void); + +/* globals */ +u16 max_cycles; +u8 status; +u16 pass_cycles; +u16 first_error_cycle; +u8 first_error_num; +unsigned char first_error_name[16]; +u16 act_cycle; + +typedef struct test_function_s { + unsigned char *name; + int (*pf)(void); +} test_function_t; + +/* max number of Burn In Functions */ +#define BIF_MAX 6 + +/* table with burn in functions */ +test_function_t test_function[BIF_MAX]; + + +int do_burn_in (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]) +{ + int i; + int cycle_status; + + if (argc > 1) { + printf ("Usage:\n%s\n", cmdtp->usage); + return 1; + } + + led_init (); + global_vars_init (); + test_function_table_init (); + + if (global_vars_write_to_eeprom () != 0) { + printf ("%s: error writing global_vars to eeprom\n", + __FUNCTION__); + return (1); + } + + if (read_max_cycles () != 0) { + printf ("%s: error reading max_cycles from eeprom\n", + __FUNCTION__); + return (1); + } + + if (max_cycles == 0) { + printf ("%s: error, burn in max_cycles = 0\n", __FUNCTION__); + return (1); + } + + status = 0; + for (act_cycle = 1; act_cycle <= max_cycles; act_cycle++) { + + cycle_status = 0; + for (i = 0; i < BIF_MAX; i++) { + + /* call test function */ + if ((*test_function[i].pf)() != 0) { + printf ("error in %s test\n", + test_function[i].name); + + /* is it the first error? */ + if (status == 0) { + status = 1; + first_error_cycle = act_cycle; + + /* do not use error_num 0 */ + first_error_num = i+1; + strncpy (first_error_name, + test_function[i].name, + sizeof (first_error_name)); + led_set (0); + } + cycle_status = 1; + } + } + /* were all tests of actual cycle OK? */ + if (cycle_status == 0) + pass_cycles++; + + /* set status LED if no error is occoured since yet */ + if (status == 0) + led_set (1); + + printf ("%s: cycle %d finished\n", __FUNCTION__, act_cycle); + + /* pause between cycles */ + sdelay (BURN_IN_CYCLE_DELAY); + } + + if (global_vars_write_to_eeprom () != 0) { + led_set (0); + printf ("%s: error writing global_vars to eeprom\n", + __FUNCTION__); + status = 1; + } + + if (status == 0) { + led_blink (); /* endless loop!! */ + return (0); + } else { + led_set (0); + return (1); + } +} + +U_BOOT_CMD( + burn_in, 1, 1, do_burn_in, + "burn_in - start burn-in test application on TRAB\n", + "\n" + " - start burn-in test application\n" + " The burn-in test could took a while to finish!\n" + " The content of the onboard EEPROM is modified!\n" +); + + +int do_dip (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]) +{ + int i, dip; + + if (argc > 1) { + printf ("Usage:\n%s\n", cmdtp->usage); + return 1; + } + + if ((dip = read_dip ()) == -1) { + return 1; + } + + for (i = 0; i < 4; i++) { + if ((dip & (1 << i)) == 0) + printf("0"); + else + printf("1"); + } + printf("\n"); + + return 0; +} + +U_BOOT_CMD( + dip, 1, 1, do_dip, + "dip - read dip switch on TRAB\n", + "\n" + " - read state of dip switch (S1) on TRAB board\n" + " read sequence: 1-2-3-4; ON=1; OFF=0; e.g.: \"0100\"\n" +); + + +int do_vcc5v (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]) +{ + int vcc5v; + + if (argc > 1) { + printf ("Usage:\n%s\n", cmdtp->usage); + return 1; + } + + if ((vcc5v = read_vcc5v ()) == -1) { + return (1); + } + + printf ("%d", (vcc5v / 1000)); + printf (".%d", (vcc5v % 1000) / 100); + printf ("%d V\n", (vcc5v % 100) / 10) ; + + return 0; +} + +U_BOOT_CMD( + vcc5v, 1, 1, do_vcc5v, + "vcc5v - read VCC5V on TRAB\n", + "\n" + " - read actual value of voltage VCC5V\n" +); + + +int do_contact_temp (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]) +{ + int contact_temp; + + if (argc > 1) { + printf ("Usage:\n%s\n", cmdtp->usage); + return 1; + } + + spi_init (); + tsc2000_reg_init (); + + contact_temp = tsc2000_contact_temp(); + printf ("%d degree C * 100\n", contact_temp) ; + + return 0; +} + +U_BOOT_CMD( + c_temp, 1, 1, do_contact_temp, + "c_temp - read contact temperature on TRAB\n", + "\n" + " - reads the onboard temperature (=contact temperature)\n" +); + + +int do_burn_in_status (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]) +{ + if (argc > 1) { + printf ("Usage:\n%s\n", cmdtp->usage); + return 1; + } + + if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_STATUS, 1, + (unsigned char*) &status, 1)) { + return (1); + } + if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_PASS_CYCLES, 1, + (unsigned char*) &pass_cycles, 2)) { + return (1); + } + if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_FIRST_ERROR_CYCLE, + 1, (unsigned char*) &first_error_cycle, 2)) { + return (1); + } + if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_FIRST_ERROR_NUM, + 1, (unsigned char*) &first_error_num, 1)) { + return (1); + } + if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_FIRST_ERROR_NAME, + 1, first_error_name, + sizeof (first_error_name))) { + return (1); + } + + if (read_max_cycles () != 0) { + return (1); + } + + printf ("max_cycles = %d\n", max_cycles); + printf ("status = %d\n", status); + printf ("pass_cycles = %d\n", pass_cycles); + printf ("first_error_cycle = %d\n", first_error_cycle); + printf ("first_error_num = %d\n", first_error_num); + printf ("first_error_name = %.*s\n",(int) sizeof(first_error_name), + first_error_name); + + return 0; +} + +U_BOOT_CMD( + bis, 1, 1, do_burn_in_status, + "bis - print burn in status on TRAB\n", + "\n" + " - prints the status variables of the last burn in test\n" + " stored in the onboard EEPROM on TRAB board\n" +); + +static int read_dip (void) +{ + unsigned int result = 0; + int adc_val; + int i; + + /*********************************************************** + DIP switch connection (according to wa4-cpu.sp.301.pdf, page 3): + SW1 - AIN4 + SW2 - AIN5 + SW3 - AIN6 + SW4 - AIN7 + + "On" DIP switch position short-circuits the voltage from + the input channel (i.e. '0' conversion result means "on"). + *************************************************************/ + + for (i = 7; i > 3; i--) { + + if ((adc_val = adc_read (i)) == -1) { + printf ("%s: Channel %d could not be read\n", + __FUNCTION__, i); + return (-1); + } + + /* + * Input voltage (switch open) is 1.8 V. + * (Vin_High/VRef)*adc_res = (1,8V/2,5V)*1023) = 736 + * Set trigger at halve that value. + */ + if (adc_val < 368) + result |= (1 << (i-4)); + } + return (result); +} + + +static int read_vcc5v (void) +{ + s32 result; + + /* VCC5V is connected to channel 2 */ + + if ((result = adc_read (2)) == -1) { + printf ("%s: VCC5V could not be read\n", __FUNCTION__); + return (-1); + } + /* + * Calculate voltage value. Split in two parts because there is no + * floating point support. VCC5V is connected over an resistor divider: + * VCC5V=ADCval*2,5V/1023*(10K+30K)/10K. + */ + result = result * 10 * 1000 / 1023; /* result in mV */ + + return (result); +} + + +static int test_dip (void) +{ + static int first_run = 1; + static int first_dip; + + if (first_run) { + if ((first_dip = read_dip ()) == -1) { + return (1); + } + first_run = 0; + debug ("%s: first_dip=%d\n", __FUNCTION__, first_dip); + } + if (first_dip != read_dip ()) { + return (1); + } else { + return (0); + } +} + + +static int test_vcc5v (void) +{ + int vcc5v; + + if ((vcc5v = read_vcc5v ()) == -1) { + return (1); + } + + if ((vcc5v > VCC5V_MAX) || (vcc5v < VCC5V_MIN)) { + return (1); + } else { + return (0); + } +} + + +static int test_rotary_switch (void) +{ + static int first_run = 1; + static int first_rs; + + if (first_run) { + /* + * clear bits in CPLD, because they have random values after + * power-up or reset. + */ + *CPLD_ROTARY_SWITCH |= (1 << 16) | (1 << 17); + + first_rs = ((*CPLD_ROTARY_SWITCH >> 16) & 0x7); + first_run = 0; + debug ("%s: first_rs=%d\n", __FUNCTION__, first_rs); + } + + if (first_rs != ((*CPLD_ROTARY_SWITCH >> 16) & 0x7)) { + return (1); + } else { + return (0); + } +} + + +static int test_sram (void) +{ + return (memory_post_tests (SRAM_ADDR, SRAM_SIZE)); +} + + +static int test_eeprom (void) +{ + unsigned char temp[sizeof (EEPROM_TEST_STRING_1)]; + int result = 0; + + /* write test string 1, read back and verify */ + if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_TEST, 1, + EEPROM_TEST_STRING_1, + sizeof (EEPROM_TEST_STRING_1))) { + return (1); + } + + if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_TEST, 1, + temp, sizeof (EEPROM_TEST_STRING_1))) { + return (1); + } + + if (strcmp (temp, EEPROM_TEST_STRING_1) != 0) { + result = 1; + printf ("%s: error; read_str = \"%s\"\n", __FUNCTION__, temp); + } + + /* write test string 2, read back and verify */ + if (result == 0) { + if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_TEST, 1, + EEPROM_TEST_STRING_2, + sizeof (EEPROM_TEST_STRING_2))) { + return (1); + } + + if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_TEST, 1, + temp, sizeof (EEPROM_TEST_STRING_2))) { + return (1); + } + + if (strcmp (temp, EEPROM_TEST_STRING_2) != 0) { + result = 1; + printf ("%s: error; read str = \"%s\"\n", + __FUNCTION__, temp); + } + } + return (result); +} + + +static int test_contact_temp (void) +{ + int contact_temp; + + spi_init (); + contact_temp = tsc2000_contact_temp (); + + if ((contact_temp < MIN_CONTACT_TEMP) + || (contact_temp > MAX_CONTACT_TEMP)) + return (1); + else + return (0); +} + + +static int i2c_write_multiple (uchar chip, uint addr, int alen, + uchar *buffer, int len) +{ + int i; + + if (alen != 1) { + printf ("%s: addr len other than 1 not supported\n", + __FUNCTION__); + return (1); + } + + for (i = 0; i < len; i++) { + if (i2c_write (chip, addr+i, alen, buffer+i, 1)) { + printf ("%s: could not write to i2c device %d" + ", addr %d\n", __FUNCTION__, chip, addr); + return (1); + } +#if 0 + printf ("chip=%#x, addr+i=%#x+%d=%p, alen=%d, *buffer+i=" + "%#x+%d=%p=\"%.1s\"\n", chip, addr, i, addr+i, + alen, buffer, i, buffer+i, buffer+i); +#endif + + udelay (30000); + } + return (0); +} + + +static int i2c_read_multiple (uchar chip, uint addr, int alen, + uchar *buffer, int len) +{ + int i; + + if (alen != 1) { + printf ("%s: addr len other than 1 not supported\n", + __FUNCTION__); + return (1); + } + + for (i = 0; i < len; i++) { + if (i2c_read (chip, addr+i, alen, buffer+i, 1)) { + printf ("%s: could not read from i2c device %#x" + ", addr %d\n", __FUNCTION__, chip, addr); + return (1); + } + } + return (0); +} + + +static int adc_read (unsigned int channel) +{ + int j = 1000; /* timeout value for wait loop in us */ + S3C2400_ADC *padc; + + padc = S3C2400_GetBase_ADC(); + channel &= 0x7; + + adc_init (); + + debug ("%s: adccon %#x\n", __FUNCTION__, padc->ADCCON); + + padc->ADCCON &= ~ADC_STDBM; /* select normal mode */ + padc->ADCCON &= ~(0x7 << 3); /* clear the channel bits */ + padc->ADCCON |= ((channel << 3) | ADC_ENABLE_START); + + debug ("%s: reading ch %d, addcon %#x\n", __FUNCTION__, + (padc->ADCCON >> 3) & 0x7, padc->ADCCON); + + while (j--) { + if ((padc->ADCCON & ADC_ENABLE_START) == 0) + break; + udelay (1); + } + + if (j == 0) { + printf("%s: ADC timeout\n", __FUNCTION__); + padc->ADCCON |= ADC_STDBM; /* select standby mode */ + return -1; + } + + padc->ADCCON |= ADC_STDBM; /* select standby mode */ + + debug ("%s: return %#x, adccon %#x\n", __FUNCTION__, + padc->ADCDAT & 0x3FF, padc->ADCCON); + + return (padc->ADCDAT & 0x3FF); +} + + +static void adc_init (void) +{ + S3C2400_ADC *padc; + + padc = S3C2400_GetBase_ADC(); + + padc->ADCCON &= ~(0xff << 6); /* clear prescaler bits */ + padc->ADCCON |= ((65 << 6) | ADC_PRSCEN); /* set prescaler */ + + return; +} + + +static void led_set (unsigned int state) +{ + S3C24X0_GPIO * const gpio = S3C24X0_GetBase_GPIO(); + + led_init (); + + switch (state) { + case 0: /* turn LED off */ + gpio->PADAT |= (1 << 12); + break; + case 1: /* turn LED on */ + gpio->PADAT &= ~(1 << 12); + break; + default: + } +} + +static void led_blink (void) +{ + led_init (); + + /* blink LED. This function does not return! */ + while (1) { + led_set (1); + udelay (1000000 / LED_BLINK_FREQ / 2); + led_set (0); + udelay (1000000 / LED_BLINK_FREQ / 2); + } +} + + +static void led_init (void) +{ + S3C24X0_GPIO * const gpio = S3C24X0_GetBase_GPIO(); + + /* configure GPA12 as output and set to High -> LED off */ + gpio->PACON &= ~(1 << 12); + gpio->PADAT |= (1 << 12); +} + + +static void sdelay (unsigned long seconds) +{ + unsigned long i; + + for (i = 0; i < seconds; i++) { + udelay (1000000); + } +} + + +static int global_vars_write_to_eeprom (void) +{ + if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_STATUS, 1, + (unsigned char*) &status, 1)) { + return (1); + } + if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_PASS_CYCLES, 1, + (unsigned char*) &pass_cycles, 2)) { + return (1); + } + if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_FIRST_ERROR_CYCLE, + 1, (unsigned char*) &first_error_cycle, 2)) { + return (1); + } + if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_FIRST_ERROR_NUM, + 1, (unsigned char*) &first_error_num, 1)) { + return (1); + } + if (i2c_write_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_FIRST_ERROR_NAME, + 1, first_error_name, + sizeof(first_error_name))) { + return (1); + } + return (0); +} + +static void global_vars_init (void) +{ + status = 1; /* error */ + pass_cycles = 0; + first_error_cycle = 0; + first_error_num = 0; + first_error_name[0] = '\0'; + act_cycle = 0; + max_cycles = 0; +} + + +static void test_function_table_init (void) +{ + int i; + + for (i = 0; i < BIF_MAX; i++) + test_function[i].pf = dummy; + + /* + * the length of "name" must not exceed 16, including the '\0' + * termination. See also the EEPROM address map. + */ + test_function[0].pf = test_dip; + test_function[0].name = "dip"; + + test_function[1].pf = test_vcc5v; + test_function[1].name = "vcc5v"; + + test_function[2].pf = test_rotary_switch; + test_function[2].name = "rotary_switch"; + + test_function[3].pf = test_sram; + test_function[3].name = "sram"; + + test_function[4].pf = test_eeprom; + test_function[4].name = "eeprom"; + + test_function[5].pf = test_contact_temp; + test_function[5].name = "contact_temp"; +} + + +static int read_max_cycles (void) +{ + if (i2c_read_multiple (I2C_EEPROM_DEV_ADDR, EE_ADDR_MAX_CYCLES, 1, + (unsigned char *) &max_cycles, 2) != 0) { + return (1); + } + + return (0); +} + +static int dummy(void) +{ + return (0); +} + +#endif /* CFG_CMD_BSP */ |